Automated UV-Vis Accessories

PIKE Technologies offers a wide range of computer controlled accessories for translating and rotating samples in the spectrophotometer beam. These tools enable mapping of sample surfaces and generating spectroscopy data as a function of sample position. Suitable for determination of film and coating thickness, multilayer film analysis, reflectivity studies, and characterization of optical materials. Applications include transmittance and specular reflectance measurements at normal and variable incident light angles. XY control for microplate type configurations (in-sample compartment and with optical fibers) is also available.

• Vertical and Horizontal R-Theta, Translation/Rotation
• Vertical XY Sampling Stage
• Horizontal XY Stage -“ In Sample Compartment or Fiber Optic Configurations
• RotatIR, for -T/A Measurements at Various Beam of Incidence Angles